ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,936, issued on April 21, was assigned to NISSAN CHEMICAL Corp. (Tokyo). "Film-forming composition having a multiple bond" was invented by ... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,937, issued on April 21, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "Photoresist top coating material ... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,938, issued on April 21, was assigned to ASML NETHERLANDS B.V. (Veldhoven, Netherlands). "Imaging system" was invented by Albertus Hartger... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,939, issued on April 21, was assigned to XSYS PREPRESS NV (Ypres, Belgium). "Method and system to determine an exposure time and/or intens... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,940, issued on April 21, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Reticle masking device, substrate processi... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,941, issued on April 21, was assigned to WINBOND ELECTRONICS CORP. (Taichung City, Taiwan). "Semiconductor structure and method for formin... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,942, issued on April 21, was assigned to ASML NETHERLANDS B.V. (Veldhoven, Netherlands). "Metrology methods and apparatuses for lithograph... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,943, issued on April 21, was assigned to Ushio Denki K.K. (Tokyo). "Exposure apparatus" was invented by Naoya Sohara (Tokyo). According t... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,944, issued on April 21, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Extreme ultraviolet source cleaning appara... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,945, issued on April 21, was assigned to CANON K.K. (Tokyo). "Position measuring method, method for manufacturing article, position measur... Read More